发明名称 Dual metal gate self-aligned integration
摘要 A semiconductor structure including at least one n-type field effect transistor (nFET) and at least one p-type field effect transistor (pFET) that both include a metal gate having nFET behavior and pFET behavior, respectively, without including an upper polysilicon gate electrode is provided. The present invention also provides a method of fabricating such a semiconductor structure.
申请公布号 US7872317(B2) 申请公布日期 2011.01.18
申请号 US20090508177 申请日期 2009.07.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CALLEGARI ALESSANDRO C.;CHUDZIK MICHAEL P.;DORIS BRUCE B.;NARAYANAN VIJAY;PARUCHURI VAMSI K.;STEEN MICHELLE L.
分类号 H01L21/70 主分类号 H01L21/70
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