发明名称 WAFER CLEANING APPARATUS AND WAPER CLEANIGN METHOD USING THE SAME
摘要 PURPOSE: A wafer cleaning apparatus and a wafer cleaning method thereof are provided to efficiently implement the minute process work by restraining the generation of oxide generated on the surface of the wafer during cleaning the silicon wafer. CONSTITUTION: A first thin layer contactor(110) separates and discharges the gas dissolved in the solution for removing the oxide film or the ultra pure wafer. The solution for removing the oxide film comprises the hydrogen fluoride or BOE. A second thin film contactor(120) is supplied with the solution for removing the oxide film or the ultra pure water discharged from the first thin film contactor and removes the gas.
申请公布号 KR20110005491(A) 申请公布日期 2011.01.18
申请号 KR20090063083 申请日期 2009.07.10
申请人 APET CO., LTD. 发明人 ROBORT HENRY PAGLIARO;HONG, SUNG HO;KIM, JIN TAE;KIM, DEOK HO
分类号 H01L21/302 主分类号 H01L21/302
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