发明名称 System and method for use in functional failure analysis by induced stimulus
摘要 A scanning/imaging system wherein an external stimulus is used for exciting a device under test (DUT). A stimulus source is included for providing a stationary stimulus with a controllable spot size to a device under test (DUT), the controllable spot size covering a portion of the DUT for excitation by the stationary stimulus. A sensor is operable for capturing at least one of a functional response signal and an optical image signal emanating from the DUT portion. A linear positioning device is operable to facilitate scanning of remaining portions of the DUT until a predetermined area thereof has been traversed. A controller is operably coupled to the linear positioning device, stimulus source and the sensor for providing the overall control thereof.
申请公布号 US7872485(B2) 申请公布日期 2011.01.18
申请号 US20080013881 申请日期 2008.01.14
申请人 COLVIN JAMES B 发明人 COLVIN JAMES B.
分类号 G01R31/305 主分类号 G01R31/305
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