发明名称 Method and apparatus for mobility enhancement in a semiconductor device
摘要 A method and apparatus is presented that provides mobility enhancement in the channel region of a transistor. In one embodiment, a channel region (18) is formed over a substrate that is bi-axially stressed. Source (30) and drain (32) regions are formed over the substrate. The source and drain regions provide an additional uni-axial stress to the bi-axially stressed channel region. The uni-axial stress and the bi-axially stress are both compressive for P-channel transistors and tensile for N-channel transistors. Both transistor types can be included on the same integrated circuit.
申请公布号 US7872311(B2) 申请公布日期 2011.01.18
申请号 US20070857122 申请日期 2007.09.18
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 ORLOWSKI MARIUS K.;VENKATESAN SURESH
分类号 H01L29/76 主分类号 H01L29/76
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