发明名称 Shielded gate trench FET with an inter-electrode dielectric having a nitride layer therein
摘要 A shielded gate field effect transistor (FET) comprises a plurality of trenches extending into a semiconductor region. A shield electrode is disposed in a bottom portion of each trench, and a gate electrode is disposed over the shield electrode in each trench. An inter-electrode dielectric (IED) extends between the shield electrode and the gate electrode. The IED comprises a first oxide layer and a nitride layer over the first oxide layer.
申请公布号 US7872305(B2) 申请公布日期 2011.01.18
申请号 US20080146791 申请日期 2008.06.26
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 HUNT SCOTT L.
分类号 H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L29/76
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