| 摘要 |
PURPOSE: A MLCC semiconductor component inspection apparatus algorithm and a system thereof are provided to improve the quality by identify the cause of defect. CONSTITUTION: A mechanical unit smoothly transfers a component onto an inspection system. An optical unit comprises a camera, a lens, a special lighting unit, and an optical filter in order to obtain the image of the component. A motion controller compensates the position of an inspection object. A host computer drives a proximity sensor, an illumination controller, and an inspection program. |
