INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD

摘要

PROBLEM TO BE SOLVED: To provide an information processing apparatus and an information processing method with which defects can be accurately detected by using semi-supervised abnormality detection.SOLUTION: There is provided an information processing apparatus detecting defects in the appearance of an object, and including: feature amount calculation means that calculates the feature amount of image data obtained by photographing the object; and detection means that detects defects in the appearance of the object by using semi-supervised abnormality detection on the basis of the feature amount calculated by the feature amount calculation means.SELECTED DRAWING: Figure 3