发明名称 REED INSPECTION DEVICE FOR SINGLE REED MUSICAL INSTRUMENT
摘要 <p>A comparison is made between the characteristics of the first surface of a reed and those of the second surface thereof, and there are displayed by objective indices the reed's lateral balance, and the hardness characteristics as compared with those of a standard reed. A holder guide (11) is provided on a rotation table (2), and a holder (10) is installed in this holder guide (11) in such a way as to be freely installed or removed. The holder (10) holds a reed (R) to be inspected. The holder (10) is inverted, thereby inspecting not only the first surface of the reed (R) but also the second surface thereof. A probe (20) is brought into contact with a surface of the reed (R) under a constant pressure, and the degree of deformation of the probe (20) is detected by a displacement sensor (30), with the rotation table (2) rotated. The width-wise stiffness distribution of the reed (R) is obtained from the sensor (30). The characteristics graph of the first surface and a graph obtained by inverting the characteristics graph of the second surface are displayed in a single image, thereby inspecting the stiffness distribution characteristics of the first surface and the second surface. Balance indices are calculated from superficial measures obtained by superimposing the characteristics graphs of the first surface and of the second surface over graphs obtained by inverting the aforementioned graphs. A hardness index is obtained on the basis of the integral values of the characteristics of the first surface and the second surface of the reed being inspected, as well as on the basis of the integral values of the characteristics of the first surface and the second surface of the standard reed.</p>
申请公布号 WO2011004574(A1) 申请公布日期 2011.01.13
申请号 WO2010JP04370 申请日期 2010.07.05
申请人 HANAI, KHOI 发明人 HANAI, KHOI
分类号 G01N3/20;G10D9/02 主分类号 G01N3/20
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