| 摘要 |
PROBLEM TO BE SOLVED: To shorten the inspection time of an inspection object, and to precisely determine the quality of the inspection object.SOLUTION: The inspection object A includes a lamp unit B and a body C for causing the lamp unit B to emit light. An imaging unit 2 picks up an image of a light emitting surface of the lamp unit B mounted on a master unit 4 of an inspection device 1. An image processing unit 52 extracts a first light emitting area from a binary image based on the pickup image. A first decision unit 54 inspects the light emitting characteristics of the lamp unit B mounted on the master unit 4 by using a first contrast value of each section of the first light emitting area and an area value of the first light emitting area, and determines the quality of the lamp unit B. The lamp unit B that is determined as a non-defective product is mounted on the body C, and the imaging unit 2 picks up an image of the light emitting surface of the lamp unit B. A second decision unit 55 calculates the maximum value of a second contrast value, inspects the light emitting characteristics of the lamp unit B mounted on the body C using the maximum value of the second contrast value, and determines the quality of the body C. |
