发明名称 |
SURFACE STATE INSPECTION APPARATUS USING PHOTOELECTRIC EFFECT |
摘要 |
PROBLEM TO BE SOLVED: To provide a surface state inspection apparatus using the photoelectric effect and capable of acquiring temporally stable OSEE signals.SOLUTION: The surface state inspection apparatus includes: an ultraviolet generating source for generating ultraviolet light; a photoelectron collecting part for collecting photoelectrons discharged from the surface of metal by the irradiation of ultraviolet light; an amplification part for amplifying a photocurrent acquired from the photoelectron collecting part; and a band passing means for passing only a spectral component in a region in the vicinity of 185 nm among ultraviolet light generated by the ultraviolet generating source and is constituted in such a way as to irradiate ultraviolet light passed through the band passing means to the surface of metal to be inspected. |
申请公布号 |
JP2011007700(A) |
申请公布日期 |
2011.01.13 |
申请号 |
JP20090152860 |
申请日期 |
2009.06.26 |
申请人 |
HOLONIX INTERNATIONAL CO LTD |
发明人 |
TAKAHASHI KUNIAKI;HAYASHI HIDETOSHI |
分类号 |
G01N21/33;G01N21/01 |
主分类号 |
G01N21/33 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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