发明名称 SURFACE STATE INSPECTION APPARATUS USING PHOTOELECTRIC EFFECT
摘要 PROBLEM TO BE SOLVED: To provide a surface state inspection apparatus using the photoelectric effect and capable of acquiring temporally stable OSEE signals.SOLUTION: The surface state inspection apparatus includes: an ultraviolet generating source for generating ultraviolet light; a photoelectron collecting part for collecting photoelectrons discharged from the surface of metal by the irradiation of ultraviolet light; an amplification part for amplifying a photocurrent acquired from the photoelectron collecting part; and a band passing means for passing only a spectral component in a region in the vicinity of 185 nm among ultraviolet light generated by the ultraviolet generating source and is constituted in such a way as to irradiate ultraviolet light passed through the band passing means to the surface of metal to be inspected.
申请公布号 JP2011007700(A) 申请公布日期 2011.01.13
申请号 JP20090152860 申请日期 2009.06.26
申请人 HOLONIX INTERNATIONAL CO LTD 发明人 TAKAHASHI KUNIAKI;HAYASHI HIDETOSHI
分类号 G01N21/33;G01N21/01 主分类号 G01N21/33
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