| 摘要 |
PROBLEM TO BE SOLVED: To provide a base material, which enables a minute displacement to be contactlessly measured without varying any physical property of a base material to be measured, and to provide a method and apparatus for measuring the minute displacement of the base material.SOLUTION: The apparatus includes: a container 1 for housing a minute-displacement applying means to apply the minute displacement in a heating or cooling operation to a random-pattern processed base material obtained by disposing a prescribed random pattern 4 with a brightness contrast on to a surface of the base material 3, wherein the random pattern 4 is formed by using a suspension obtained by dispersing particles in a solvent, whose sizes are about 1/1000-1/100 of the size of a prescribed visual field set when observing the surface of the base material 3; and an image processing system (5, 6, 7, 8, 9 and 10) for obtaining the minute displacement of the base material generated by the minute-displacement applying means, by using a digital image correlation technique. |
