发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device and a substrate processing apparatus that are capable of controlling easily a composition of a metal compound film, and forming a high quality film meeting a usage and forming a high performance film having a low contact resistance by forming a bonding with a base layer.SOLUTION: A TiN film is formed by a first step of forming a TiN intermediate film on a wafer by supplying TiCland NHreacting with the TiClto the wafer and controlling a processing condition for causing a bonding branch that has not undergone a substitution reaction to remain at a predetermined concentration at a part of TiCland a second step of substituting the bonding branch contained in the TiN intermediate film by supplying Hto the wafer, the first step and the second step being performed in this order. |
申请公布号 |
JP2011006782(A) |
申请公布日期 |
2011.01.13 |
申请号 |
JP20100115334 |
申请日期 |
2010.05.19 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
SAKAI MASANORI;SAITO TATSUYUKI |
分类号 |
C23C16/34 |
主分类号 |
C23C16/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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