发明名称 MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide a measuring instrument which can perform high-precision measurement.SOLUTION: The measuring instrument 1 includes: a housing 2 which incorporates a measuring circuit 3 having a semiconductor device 32 for performing measurement processing and has a hermetically sealed structure; a fan 6 for stirring the gas within the housing 2; a dehumidifying agent 7 for removing the water within the housing 2; a first heat sink 4 which is provided in close contact with the semiconductor device 32 to radiate the heat of the semiconductor device 32 into the inside of the housing 2; and a second heat sink 5 which is provided on the inner surface of the housing 2 to radiate the heat within the housing 2 into the outside of the housing 2.
申请公布号 JP2011007600(A) 申请公布日期 2011.01.13
申请号 JP20090150707 申请日期 2009.06.25
申请人 SEIKO EPSON CORP 发明人 NAKATANI TOSHIYUKI
分类号 G01D11/24;G01R1/04 主分类号 G01D11/24
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