发明名称 Bias-temperature induced damage mitigation circuit
摘要 A circuit that regulates electrical current flow through an integrated circuit involves a sequencing circuit connected to a clock signal generator, the sequencing circuit configured to, responsive to receiving a clock signal from the clock signal generator, generate a set of sequencing signals that includes a first switching signal, a second switching signal, and a disable signal. The circuit also involves a switching circuit connected to the sequencing circuit, the switching circuit configured to receive the first switching signal and the second switching signal and a current mirror connected to the switching circuit and the sequencing circuit, the current mirror configured to receive an activation signal from a current control logic circuit and to receive the disable signal.
申请公布号 US9405311(B1) 申请公布日期 2016.08.02
申请号 US201514736344 申请日期 2015.06.11
申请人 International Business Machines Corporation 发明人 Onsongo David M.;Paulsen David P.;Peterson Kirk D.;Sheets, II John E.
分类号 G05F3/26;H03K19/094 主分类号 G05F3/26
代理机构 代理人 Dobson Scott S.;Williams Robert
主权项 1. A method of regulating a flow of electrical current in an integrated circuit, the method comprising: sending, by a current control logic circuit, an activation signal; generating, by a clock signal generator, a clock signal; generating, by a sequencing circuit, from the clock signal, a set of sequencing signals that includes a first switching signal, a second switching signal, and a disable signal, the sequencing circuit including at least one inverter and at least one frequency divider, the first switching signal and the second switching signal generated before a first frequency divider in the sequencing circuit, the disable signal generated after the first frequency divider in the sequencing circuit; receiving, by a switching circuit, the first switching signal and the second switching signal; and receiving, by a current mirror, the activation signal and the disable signal.
地址 Armonk NY US