发明名称 POLISHING COMPOSITION AND POLISHING METHOD
摘要 To provide a polishing composition which has a high removal rate and enables to suppress occurrence of dishing and erosion, in polishing of a surface to be polished in the production of a semiconductor integrated circuit device. A chemical mechanical polishing composition for polishing a surface to be polished of a semiconductor integrated circuit device comprises (A) fine oxide particles, (B) pullulan, and (C) water. The polishing composition further contains (D) an oxidizing agent, and (E) a compound represented by the formula 1: wherein R is a hydrogen atom, a C1-4 alkyl group, a C1-4 alkoxy group or a carboxylic acid group.
申请公布号 US2011008965(A1) 申请公布日期 2011.01.13
申请号 US20100859793 申请日期 2010.08.20
申请人 ASAHI GLASS COMPANY LIMITED;SEIMI CHEMICAL CO., LTD. 发明人 TAKEMIYA SATOSHI;SHINMARU SACHIE
分类号 H01L21/463;B24B37/00;C09K3/14;C09K13/00;H01L21/304;H01L21/3105;H01L21/321;H01L21/465 主分类号 H01L21/463
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