发明名称 SYSTEM FOR MEASURING THE DEFORMATION OF A STRUCTURE WITH INTERFEROMETRIC LASER SENSORS
摘要 <p>System for measuring the deformation of a structure comprising a plurality of interferometric Laser sensors (L) mounted rigidly on the structure to form a measurement grid (RM) comprising at least one triangular grid, wherein on each side of the triangular grids are disposed an emitter and a reflecting target of a respective Laser sensor (L) for detecting a value being representative for the displacement of two points for each side of the triangular grids.</p>
申请公布号 WO2011004307(A1) 申请公布日期 2011.01.13
申请号 WO2010IB53067 申请日期 2010.07.05
申请人 SINTESI SCPA;CATTANI, ENRICO;MODICA, FRANCESCO;BRONDI, ALESSANDRO;SIDDIOLO, ANTONINO 发明人 CATTANI, ENRICO;MODICA, FRANCESCO;SIDDIOLO, ANTONINO
分类号 B23Q17/22;B23Q17/24;G01B11/24 主分类号 B23Q17/22
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