发明名称 MEASURING METHOD AND MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a measuring method and a measuring device for performing quick measurement while enabling measurement at a job site or the like.SOLUTION: A zero point error Δz is easily obtained from a difference αbetween the inclinations of a probe MP at a start point and an end point. Thereby the shape of the whole face to be measured is accurately obtained. In other words, since the zero point error Δz is obtained only by reading inclinations with a level twice, reduction of a measuring time is achieved, e.g. working at a job site or the like is easy.
申请公布号 JP2011007718(A) 申请公布日期 2011.01.13
申请号 JP20090153399 申请日期 2009.06.29
申请人 KIYONO SATOSHI;OBISHI KEIKI SEISAKUSHO:KK 发明人 KIYONO SATOSHI;SHIMAZU KATSUYOSHI;IKEUCHI KATSUNORI
分类号 G01B5/20;G01B5/28;G01B21/30 主分类号 G01B5/20
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