发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To peel off a nitride semiconductor device layer from a substrate in a manner that the nitride semiconductor device layer may not be etched.SOLUTION: The method of manufacturing a semiconductor device includes: a step to form an etching sacrificial layer 13 on a substrate 12; a step to form an etching stopper layer 2 on the etching sacrificial layer 13; a step to form a nitride semiconductor device layer 1 on the etching stopper layer 2; and a step to remove the etching sacrificial layer 13 by photoelectrochemical etching. The etching stopper layer 2 is a layer to prevent holes from accumulating in the nitride semiconductor device layer 1.
申请公布号 JP2011009521(A) 申请公布日期 2011.01.13
申请号 JP20090152292 申请日期 2009.06.26
申请人 FUJITSU LTD 发明人 OKAMOTO NAOYA;MINOURA YUICHI
分类号 H01L21/3063;H01L21/306;H01L21/338;H01L27/12;H01L29/778;H01L29/80;H01L29/812;H01L33/32;H01S5/343 主分类号 H01L21/3063
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