发明名称 IMPROVEMENT OF BEAM QUALITY IN FIB SYSTEM
摘要 PROBLEM TO BE SOLVED: To enhance beam quality for milling of a liquid metal ion beam.SOLUTION: The asymmetrical energy distribution of ions from an ion source allows chromatic aberration to be reduced by filtering ions in the low energy beam tail without significantly reducing processing time. A preferred embodiment includes within an ion beam column a filter that removes the low energy ions from the beam.
申请公布号 JP2011009215(A) 申请公布日期 2011.01.13
申请号 JP20100139142 申请日期 2010.06.18
申请人 FEI CO 发明人 SCHWIND GREGORY A;ORLOFF JONATHAN H
分类号 H01J37/317;H01J37/05 主分类号 H01J37/317
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