发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR WAFER AND SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor wafer capable of achieving the high-quality crystal growth of a single crystal nitride semiconductor while using a lattice mismatch substrate.SOLUTION: The manufacturing method includes a step for forming a graphene layer 110 on the surface of a semiconductor substrate 101, a step for making the center of a honeycomb structure indicative of the arrangement of carbon atoms of the graphene layer 110 adsorb one element constituting a crystal of the single crystal semiconductor layer, a step for bonding the other element different from one element constituting the crystal to one element to form a first layer 114 of the crystal, and a step for further progressing the crystal growth of a predetermined number of crystal semiconductor layers on the surface of the first layer.
申请公布号 JP2011009281(A) 申请公布日期 2011.01.13
申请号 JP20090148666 申请日期 2009.06.23
申请人 OKI DATA CORP;OKI DIGITAL IMAGING CORP 发明人 OGIWARA MITSUHIKO;SAGIMORI TOMOHIKO;SAKUTA MASAAKI;HASHIMOTO AKIHIRO
分类号 H01L21/20;H01L21/02;H01L21/205 主分类号 H01L21/20
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