发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR WAFER AND SEMICONDUCTOR WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor wafer capable of achieving the high-quality crystal growth of a single crystal nitride semiconductor while using a lattice mismatch substrate.SOLUTION: The manufacturing method includes a step for forming a graphene layer 110 on the surface of a semiconductor substrate 101, a step for making the center of a honeycomb structure indicative of the arrangement of carbon atoms of the graphene layer 110 adsorb one element constituting a crystal of the single crystal semiconductor layer, a step for bonding the other element different from one element constituting the crystal to one element to form a first layer 114 of the crystal, and a step for further progressing the crystal growth of a predetermined number of crystal semiconductor layers on the surface of the first layer. |
申请公布号 |
JP2011009281(A) |
申请公布日期 |
2011.01.13 |
申请号 |
JP20090148666 |
申请日期 |
2009.06.23 |
申请人 |
OKI DATA CORP;OKI DIGITAL IMAGING CORP |
发明人 |
OGIWARA MITSUHIKO;SAGIMORI TOMOHIKO;SAKUTA MASAAKI;HASHIMOTO AKIHIRO |
分类号 |
H01L21/20;H01L21/02;H01L21/205 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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