发明名称 |
METHOD OF GAP FILLING IN A SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A gap-filling method of a semiconductor device is provided to simultaneously implement the deposition process and the etching process of an insulating film by simultaneously receiving etching gas radial and gaseous deposition gas. CONSTITUTION: A plurality of patterns is formed on a substrate(10). A pad oxide film(20) and a pad nitride film(30) are formed on the upper side of the substrate. Parts of the pad nitride film and the oxide film are etched and parts of the substrate are etched to form a trench. A gap-filling insulating film(50) is deposited between the patterns. The trench is filled with the gap-filling insulating film.
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申请公布号 |
KR20110004258(A) |
申请公布日期 |
2011.01.13 |
申请号 |
KR20100028979 |
申请日期 |
2010.03.31 |
申请人 |
ATTO CO., LTD. |
发明人 |
KWON, YOUNG SOO;YANG, DOO HO;LIM, SUK KYU |
分类号 |
H01L21/762;H01L21/31 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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