发明名称 Ultrathin semiconductor circuit having contact bumps
摘要 The invention relates to an ultrathin semiconductor circuit having contact bumps and to a corresponding production method. The semiconductor circuit includes a bump supporting layer having a supporting layer thickness and having a supporting layer opening for uncovering a contact layer element being formed on the surface of a semiconductor circuit. An electrode layer is situated on the surface of the contact layer element within the opening of the bump supporting layer, on which electrode layer is formed a bump metallization for realizing the contact bump. On account of the bump supporting layer, a thickness of the semiconductor circuit can be thinned to well below 300 micrometers, with the wafer reliably being prevented from breaking. Furthermore, the moisture barrier properties of the semiconductor circuit are thereby improved.
申请公布号 US7868452(B2) 申请公布日期 2011.01.11
申请号 US20060441978 申请日期 2006.05.26
申请人 INFINEON TECHNOLOGIES AG 发明人 MUELLER DIRK;SCHNEEGANS MANFRED;SGOURIDIS SOKRATIS
分类号 H01L23/48;H01L21/60;H01L23/00;H01L23/485;H01L23/525 主分类号 H01L23/48
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