发明名称 Reduction of etch-rate drift in HDP processes
摘要 A processing chamber is seasoned by providing a flow of season precursors to the processing chamber. A high-density plasma is formed from the season precursors by applying at least 7500 W of source power distributed with greater than 70% of the source power at a top of the processing chamber. A season layer having a thickness of at least 5000 Å is deposited at one point using the high-density plasma. Each of multiple substrates is transferred sequentially into the processing chamber to perform a process that includes etching. The processing chamber is cleaned between sequential transfers of the substrates.
申请公布号 US7867921(B2) 申请公布日期 2011.01.11
申请号 US20080204503 申请日期 2008.09.04
申请人 APPLIED MATERIALS, INC. 发明人 WANG ANCHUAN;LEE YOUNG S.;VELLAIKAL MANOJ;BLOKING JASON THOMAS;JEON JIN HO;MUNGEKAR HEMANT P.
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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