发明名称 Dynamic type semiconductor memory device and operation method of the same
摘要 A dynamic type semiconductor memory device includes a sense amplifier connected with a bit line pair to amplify and sense a voltage difference on the bit line pair; a precharge circuit configured to precharge the bit line pair to a power supply voltage on a lower side in response to a first control signal; a memory cell capacitance having one end which is connected with the bit line pair through a first switch circuit which is controlled in response to a signal on a word line; and a reference cell capacitance having one end which is connected with the bit line pair through a second switch circuit which is controlled in response to a signal on a reference word line. The other end of the memory cell capacitance and the other end of the reference cell capacitance are electrically separated.
申请公布号 US7869292(B2) 申请公布日期 2011.01.11
申请号 US20090502692 申请日期 2009.07.14
申请人 RENESAS ELECTRONICS CORPORATION 发明人 YANO NOBUMITSU;TANABE SHOGO
分类号 G11C7/00 主分类号 G11C7/00
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