发明名称 Burn-in test socket having spring-biased latches facilitating electrical interconnection between chips and socket when actuated
摘要 An electrical connector includes an insulative housing (1) defining a pair of guiding recesses (14), a connecting member (2) mounted in the insulative housing for connecting with a chip, a number of resilient members (4) received in the guiding recesses, a pair of latches (3) each having a pivot (34) mounted in the insulative housing and supported by the resilient members, and an actuator (3) mounted on the insulative housing and formed with a number of latching portions (63) in contact with the latch. The actuator is moveable along an up-to-down direction to drive the latch pivotable about the pivot between a locked position and an unlocked position.
申请公布号 US7866987(B2) 申请公布日期 2011.01.11
申请号 US20100702335 申请日期 2010.02.09
申请人 HON HAI PRECISION IND.CO., LTD. 发明人 CHEN MING-YUE
分类号 H01R12/00 主分类号 H01R12/00
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