发明名称 Temperature control method for photolithographic substrate
摘要 The present invention provides a method for processing a photolithographic substrate, comprising the placement of the photolithographic substrate on a support member in a chamber wherein the photolithographic substrate has an initial temperature of about zero degrees Celsius to about fifty degrees Celsius. A heat transfer fluid is introduced into the chamber to cool the photolithographic substrate to a target temperature of less than about zero degrees Celsius to less than about minus forty degrees Celsius. The cooled photolithographic substrate is subjected to a plasma process before the temperature of the cooled photolithographic substrate reaches the initial temperature.
申请公布号 US7867403(B2) 申请公布日期 2011.01.11
申请号 US20070756074 申请日期 2007.05.31
申请人 PLUMHOFF JASON;RYAN LARRY;NOLAN JOHN;JOHNSON DAVID;WESTERMAN RUSSELL 发明人 PLUMHOFF JASON;RYAN LARRY;NOLAN JOHN;JOHNSON DAVID;WESTERMAN RUSSELL
分类号 B44C1/22;C25F3/00 主分类号 B44C1/22
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