发明名称 DATA SAMPLING CIRCUIT OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A data sampling circuit of a semiconductor device is provided to perform a sampling operation by extending a pulse width of the inputted digital signal. CONSTITUTION: A first input unit(300) performs a sampling operation based on a clock signal by receiving a data signal. A second input unit(320) performs a sampling operation based on a clock signal by receiving a signal which is delayed corresponding to a data signal. An output unit outputs a sampling data signal by combining an output signal of the first input unit and the second input unit. The first input unit changes the logic level of the output signal in response to the logic level of the data. The first input unit changes the logic level of the output signal in response to the logic level of the data signal detected at a first edge of a clock signal. The first input unit prevents the change of the logic level of the output signal regardless of the logic level of the data signal detected at a second edge of the clock signal.
申请公布号 KR20110002330(A) 申请公布日期 2011.01.07
申请号 KR20090059866 申请日期 2009.07.01
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JI WANG;KIM, YONG JU;HAN, SUNG WOO;SONG, HEE WOONG;OH, IC SU;KIM, HYUNG SOO;HWANG, TAE JIN;CHOI, HAE RANG;JANG, JAE MIN;PARK, CHANG KUN
分类号 H03K7/02;G11C27/02 主分类号 H03K7/02
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