PURPOSE: A semiconductor device manufacturing method is provided to prevent the swelling phenomenon of the back of a radiation fin by separating the semiconductor device using etching. CONSTITUTION: An active layer(42) is formed on a substrate(41). A first metal layer(43) is formed on the first side of the substrate. A radiation fin(45) is formed along a radiation fin forming pattern(44) on the first metal layer. A support layer(46) is formed on the radiation fin forming pattern and the radiation fin.
申请公布号
KR20110002135(A)
申请公布日期
2011.01.07
申请号
KR20090059568
申请日期
2009.07.01
申请人
AGENCY FOR DEFENSE DEVELOPMENT
发明人
RHEE, JIN KOO;LEE, SEONG DAE;KIM, MI RA;MIN, DAE HONG;UHM, WON YOUNG