发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING SYSTEM
摘要 Provided is a method of manufacturing a semiconductor device. In the method, an aluminium-containing insulation film is formed on an electrode film of a substrate by alternately repeating a process of supplying an aluminium precursor into a processing chamber in which the substrate is accommodated and exhausting the aluminium precursor from the processing chamber and a process of supplying an oxidizing or nitriding precursor into the processing chamber and exhausting the oxidizing or nitriding precursor from the processing chamber; and a high permittivity insulation film different from the aluminium-containing insulation film is formed on the aluminium-containing insulation film by alternately repeating a process of supplying a precursor into the processing chamber and exhausting the precursor from the processing chamber and a process of supplying an oxidizing precursor into the processing chamber and exhausting the oxidizing precursor from the processing chamber. In addition, heat treatment is performed on the substrate.
申请公布号 US2011003482(A1) 申请公布日期 2011.01.06
申请号 US20100825012 申请日期 2010.06.28
申请人 HITACHI-KOKUSAI ELECTRIC INC. 发明人 OGAWA ARITO;HORII SADAYOSHI;SATO TAKETOSHI;ITATANI HIDEHARU;MISE NOBUYUKI;TONOMURA OSAMU
分类号 H01L21/314;B05C11/10 主分类号 H01L21/314
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