发明名称 METHOD FOR MANUFACTURING SILICON STRUCTURE, DEVICE FOR MANUFACTURING SAME, AND PROGRAM FOR MANUFACTURING SAME
摘要 <p>A method for manufacturing a silicon structure comprises a step for etching a silicon region of an object to be processed that includes the silicon region by alternately repeating a first step for converting first iodine fluoride as an etching gas into plasma by applying first high-frequency power and a second step for converting second iodine fluoride as a protective film forming gas into plasma by applying second high-frequency power lower than the first high-frequency power. As a result, a silicon structure having high perpendicularity and a good sidewall shape can be obtained by anisotropic dry etching of silicon which exerts less influence on global warming.</p>
申请公布号 WO2011001779(A1) 申请公布日期 2011.01.06
申请号 WO2010JP59344 申请日期 2010.06.02
申请人 SUMITOMO PRECISION PRODUCTS CO., LTD.;SASAKURA, MASAHIRO;YAMAMOTO, TAKASHI;NOZAWA, YOSHIYUKI 发明人 SASAKURA, MASAHIRO;YAMAMOTO, TAKASHI;NOZAWA, YOSHIYUKI
分类号 H01L21/3065;B81C1/00 主分类号 H01L21/3065
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