| 摘要 |
PROBLEM TO BE SOLVED: To provide a low-cost characteristic measuring device for electronic components capable of preventing defects caused by generated heat in a multi-measuring system beforehand, without having to increase the size of a heat radiation facility, and the like.SOLUTION: The characteristic measuring device includes a measuring device 75, that contacts an external electrode of each of a plurality of chip-type capacitors transported to a measurement position C by a turntable 50 and measures the insulation resistance; and a controller 80 for controlling the turntable 50, the measuring device 75, and the like. The controller 80 determines calorific value, based on a preliminarily determined heat-generating coefficient, applied voltage, and voltage application interval, and also determines the heat release, based on a preliminarily determined heat release coefficient and transportation time. When the calorific value becomes larger than the heat released, the controller stops the operation of the turntable 50 and the measuring device 75 or extends the transportation time by the turntable 50. |
