PROBE UNIT FOR TESTING PANEL

摘要

There is provided a probe unit for testing a panel. The probe unit includes a body block and a flexible printed circuit board (FPCB). The body block with a bottom on which a taped-automated-bonded (TAB) integrated circuit (IC) used in the panel is mounted, the TAB IC in contact with leads of the panel. On a side opposite to a contact portion between the TAB IC and the panel, there is formed a buffer block maintaining flatness of the contact portion and providing elasticity there to. The FPCB is electrically connected to a rear of the TAB IC and transmits a test signal to the panel via the TAB IC.