发明名称 PLASMA ETCHING METHOD, AND PLASMA ETCHING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a plasma etching method and a plasma etching apparatus of high speed/high yield.SOLUTION: A material to be etched 1 is placed in a reaction container 2 and etched by introducing the etching gas and generating plasma 6 between the material to be etched 1 and an electrode 4 for generating plasma. The material to be etched 1 is composed of a permeable substance having voids inside.
申请公布号 JP2011003597(A) 申请公布日期 2011.01.06
申请号 JP20090143462 申请日期 2009.06.16
申请人 SHARP CORP;OSAKA UNIV 发明人 NAKAHAMA KOJI;FUNAKI TAKESHI;DAISAN HIROMASA;YASUTAKE KIYOSHI
分类号 H01L21/3065 主分类号 H01L21/3065
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