发明名称 |
PLASMA ETCHING METHOD, AND PLASMA ETCHING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a plasma etching method and a plasma etching apparatus of high speed/high yield.SOLUTION: A material to be etched 1 is placed in a reaction container 2 and etched by introducing the etching gas and generating plasma 6 between the material to be etched 1 and an electrode 4 for generating plasma. The material to be etched 1 is composed of a permeable substance having voids inside. |
申请公布号 |
JP2011003597(A) |
申请公布日期 |
2011.01.06 |
申请号 |
JP20090143462 |
申请日期 |
2009.06.16 |
申请人 |
SHARP CORP;OSAKA UNIV |
发明人 |
NAKAHAMA KOJI;FUNAKI TAKESHI;DAISAN HIROMASA;YASUTAKE KIYOSHI |
分类号 |
H01L21/3065 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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