发明名称 METHOD OF CREATING ASYMMETRIC FIELD-EFFECT-TRANSISTORS
摘要 <p>PURPOSE: A method for manufacturing an asymmetric field-effect transistor(FET) is provided to prevent photo-resist bridging and scumming phenomena by maintaining a space between a photo-resist and a FET gate without a photo-resist opening. CONSTITUTION: A semiconductor substrate(101) is prepared. The first gate conductor and the second gate conductor of transistors are formed on the upper side of the substrate. A gate insulating layer(201) is formed on the upper side of the substrate. A gate conductive layer(301) is formed on the upper side of the gate insulating layer. A hard mask layer(401) is formed on the upper side of the gate conductive layer. A photo-resist pattern(502) is formed on the upper side of the hard mask layer.</p>
申请公布号 KR20110001886(A) 申请公布日期 2011.01.06
申请号 KR20100052153 申请日期 2010.06.03
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FREEMAN GREGORY G.;NARASIMHA SHREESH;SU NING;NAYFEH HASAN MUNIR;ROVEDO NIVO;RAUSCH WERNER A.;YU JIAN YU
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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