发明名称 |
METHOD OF CREATING ASYMMETRIC FIELD-EFFECT-TRANSISTORS |
摘要 |
<p>PURPOSE: A method for manufacturing an asymmetric field-effect transistor(FET) is provided to prevent photo-resist bridging and scumming phenomena by maintaining a space between a photo-resist and a FET gate without a photo-resist opening. CONSTITUTION: A semiconductor substrate(101) is prepared. The first gate conductor and the second gate conductor of transistors are formed on the upper side of the substrate. A gate insulating layer(201) is formed on the upper side of the substrate. A gate conductive layer(301) is formed on the upper side of the gate insulating layer. A hard mask layer(401) is formed on the upper side of the gate conductive layer. A photo-resist pattern(502) is formed on the upper side of the hard mask layer.</p> |
申请公布号 |
KR20110001886(A) |
申请公布日期 |
2011.01.06 |
申请号 |
KR20100052153 |
申请日期 |
2010.06.03 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
FREEMAN GREGORY G.;NARASIMHA SHREESH;SU NING;NAYFEH HASAN MUNIR;ROVEDO NIVO;RAUSCH WERNER A.;YU JIAN YU |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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