| 摘要 |
A test circuit provided to monitor a bandgap circuit that outputs a bandgap reference voltage The test circuit includes a reference voltage test module to output a first pass signal when an operating voltage of the bandgap circuit is greater than a first threshold voltage; an output test module to output a second pass signal when an output voltage of the bandgap circuit is greater than a second threshold voltage; and an overdrive test module to output a third pass signal when a minimum operating voltage of the test circuit is detected. Furthermore, a logic circuit is provided and coupled to outputs of each of the test modules. The logic circuit is further configured to output an operating signal, which indicates that the bandgap reference voltage is stable, after receiving the first, second, and third pass signals.
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