发明名称 CHARGED PARTICLE BEAM IRRADIATION SYSTEM
摘要 PROBLEM TO BE SOLVED: To shorten the irradiation time even when the number of spots increases and also apply a target dose of beams to each spot with good accuracy in a spot scanning method.SOLUTION: A central control device 46 decides a target beam current value in advance according to the target dose so that the irradiation time is substantially uniform at every spot. An accelerator control part 47 adjusts a current value of a charged particle beam emitted from a synchrotron 4 to obtain the target beam current value. The central control device 46 calculates a delay dose to the beam current value in advance, and on reaching a set dose obtained by subtracting the delay dose from the target dose, an irradiation device control part 48 and the accelerator control device 47 start the control to output an emission stop signal and stop beam emission.
申请公布号 JP2011000378(A) 申请公布日期 2011.01.06
申请号 JP20090147664 申请日期 2009.06.22
申请人 HITACHI LTD 发明人 FUJII YUSUKE;HIRAMOTO KAZUO;AKIYAMA HIROSHI;NISHIUCHI HIDEAKI
分类号 A61N5/10;H05H13/04 主分类号 A61N5/10
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