发明名称 SILICON WAFER AND METHOD OF MANUFACTURING THE SAME, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a silicon wafer which is suitable for a semiconductor device which is made to be thin and has a reverse surface polished in a device post-process.SOLUTION: A method of manufacturing a silicon wafer includes a process S11 of preparing a silicon substrate 11, a first epitaxial process S13 of growing an n-type epitaxial film 12 on the silicon substrate 11, and a second epitaxial process S14 of growing a second epitaxial film 13 in which the device is formed on the epitaxial film 12. According to the method of manufacturing a silicon wafer, since the n-type first epitaxial film 12 formed under the second epitaxial film 13 in which the device is formed functions as a barrier layer, heavy metal introduced from the reverse-surface side of the silicon wafer in the device post-process never reaches a device region.
申请公布号 JP2011003577(A) 申请公布日期 2011.01.06
申请号 JP20090143059 申请日期 2009.06.16
申请人 SUMCO CORP 发明人 ADACHI HISASHI;MURATA DAISUKE;TORIGOE KAZUNAO;MOTOYAMA TAMIO;NAGABUCHI AKIRA
分类号 H01L21/322;H01L21/205 主分类号 H01L21/322
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