首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Verfahren zur Bewertung der Güte und Eignung von Waferspannvorrichtungen
摘要
申请公布号
DE10145187(B4)
申请公布日期
2011.01.05
申请号
DE20011045187
申请日期
2001.09.13
申请人
INFINEON TECHNOLOGIES AG
发明人
ERB, HANS-PETER;BIERINGER, FRITZ;STEINKIRCHNER, ERWIN;MAERITZ, JOERN
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
您可能感兴趣的专利
MANUFACTURING METHOD OF LEAD FRAME
READING DEVICE AND LINEAR LINE SENSOR USED FOR THE DEVICE
METHOD FOR EXPANDING COMPRESSED DATA STREAM
WIRING BOARD AND MANUFACTURE THEREOF
ELECTRONIC CIRCUIT FORMING BODY
LIQUID MATERIAL VAPORIZER
CVD DEVICE CLEANING METHOD, AND SELECTIVE CVD METHOD, AND CVD DEVICE
ELECTROLUMINESCENT ELEMENT
VACUUM CONTAINER
D.C. BREAKER DEVICE, AND D.C. POWER TRANSMISSION SYSTEM USING IT
SWITCH APPARATUS
VENDING MACHINE THAT CAN SELL IN MASS
MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT
MOUNTING STRUCTURE FOR CONNECTOR
MANUFACTURE OF REAR PLATE OF PLASMA DISPLAY PANEL
REDUNDANT ADDRESS COMPARING CIRCUIT FOR MEMORY DEVICE
INFORMATION SIGNAL RECORDING/REPRODUCING DEVICE, RECORDING/REPRODUCING METHOD AND RECORDING MEDIUM
METHOD FOR ADJUSTING SIGNAL RECORDING AND REPRODUCING DEVICE
OPTICAL DISK REPRODUCING DEVICE
HEAD CLEANING DEVICE
