发明名称 Methods and apparatus for outlier detection for high dimensional data sets
摘要 Methods and apparatus are provided for outlier detection in databases by determining sparse low dimensional projections. These sparse projections are used for the purpose of determining which points are outliers. The methodologies of the invention are very relevant in providing a novel definition of exceptions or outliers for the high dimensional domain of data.
申请公布号 US7865456(B2) 申请公布日期 2011.01.04
申请号 US20080134371 申请日期 2008.06.06
申请人 TREND MICRO INCORPORATED 发明人 AGGARWAL CHARU C.;YU PHILIP SHI-LUNG
分类号 G06N5/00 主分类号 G06N5/00
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