发明名称 |
Disposable built-in self-test devices, systems and methods for testing three dimensional integrated circuits |
摘要 |
A device and method for self-testing an integrated circuit layer for a three-dimensional integrated circuit includes integrally forming a disposable self-test circuit on a common substrate with a first circuit to be tested. The first circuit forms a layer in a three-dimensional integrated circuit structure. The first circuit is tested using circuitry of the self-test circuit. The self-test circuit is removed by detaching the self-test circuit from the first circuit.
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申请公布号 |
US7863918(B2) |
申请公布日期 |
2011.01.04 |
申请号 |
US20070939145 |
申请日期 |
2007.11.13 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
JENKINS KEITH A.;KIM SEONGWON |
分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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