发明名称 Semiconductor device and a method for manufacturing the same
摘要 A thin film transistor of the present invention has an active layer including at least source, drain and channel regions formed on an insulating surface. A high resistivity region is formed between the channel region and each of the source and drain regions. A film capable of trapping positive charges therein is provided on at least the high resistivity region so that N-type conductivity is induced in the high resistivity region. Accordingly, the reliability of N-channel type TFT against hot electrons can be improved.
申请公布号 US7863619(B2) 申请公布日期 2011.01.04
申请号 US20090427139 申请日期 2009.04.21
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 TAKEMURA YASUHIKO;TERAMOTO SATOSHI
分类号 H01L29/10;H01L21/336;H01L21/77;H01L21/84;H01L27/13;H01L29/786 主分类号 H01L29/10
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