发明名称 Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device
摘要 For enhancing the high performance of a non-volatile semiconductor memory device having an MONOS type transistor, a non-volatile semiconductor memory device is provided with MONOS type transistors having improved performance in which the memory cell of an MONOS non-volatile memory comprises a control transistor and a memory transistor. A control gate of the control transistor comprises an n-type polycrystal silicon film and is formed over a gate insulative film comprising a silicon oxide film. A memory gate of the memory transistor comprises an n-type polycrystal silicon film and is disposed on one of the side walls of the control gate. The memory gate comprises a doped polycrystal silicon film with a sheet resistance lower than that of the control gate comprising a polycrystal silicon film formed by ion implantation of impurities to the undoped silicon film.
申请公布号 US7863135(B2) 申请公布日期 2011.01.04
申请号 US20100706668 申请日期 2010.02.16
申请人 RENESAS ELECTRONICS CORPORATION 发明人 SAKAI TAKESHI;ISHII YASUSHI;OKAZAKI TSUTOMU;NAKAMICHI MASARU;MATSUI TOSHIKAZU;NITTA KYOYA;MACHIDA SATORU;NAKAGAWA MUNEKATSU;TSUKADA YUICHI
分类号 H01L21/00 主分类号 H01L21/00
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