PURPOSE: A semiconductor device manufacturing method is provided to restrain the leak current of a semiconductor device by improving the crystalline of a bottom electrode by implementing the heat treatment for the bottom electrode before depositing a dielectric layer. CONSTITUTION: A first interlayer insulating film(120) is formed on a substrate(100). The imbedded contact plugs(130a, 130b, 130c) are formed within the first interlayer insulating film. A second interlayer insulation layer is formed on the first interlayer insulating film and the imbedded contact plug. A contact hole exposing the imbedded contact plug is formed within the second interlayer insulation film.
申请公布号
KR20110000290(A)
申请公布日期
2011.01.03
申请号
KR20090057719
申请日期
2009.06.26
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, JIN BUM;KIM, WOOK JE;LEE, KWAN HEUM;SHIN, YU GYUN;LEE, SUN GHIL