发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A semiconductor device manufacturing method is provided to restrain the leak current of a semiconductor device by improving the crystalline of a bottom electrode by implementing the heat treatment for the bottom electrode before depositing a dielectric layer. CONSTITUTION: A first interlayer insulating film(120) is formed on a substrate(100). The imbedded contact plugs(130a, 130b, 130c) are formed within the first interlayer insulating film. A second interlayer insulation layer is formed on the first interlayer insulating film and the imbedded contact plug. A contact hole exposing the imbedded contact plug is formed within the second interlayer insulation film.
申请公布号 KR20110000290(A) 申请公布日期 2011.01.03
申请号 KR20090057719 申请日期 2009.06.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JIN BUM;KIM, WOOK JE;LEE, KWAN HEUM;SHIN, YU GYUN;LEE, SUN GHIL
分类号 H01L21/3205 主分类号 H01L21/3205
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