发明名称 |
METHOD FOR FABRICATING CONTACTS OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A semiconductor device contact forming method is provided to restrain the writing restoration time defect and improve the operation speed of a component by reducing the contact resistance by injecting the nitride and oxygen gas into the doped polysilicon. CONSTITUTION: A contact(400) passing through the interlayer dielectric layer on a semiconductor substrate(100) is formed including the poly-silicon. The impurity is doped in polysilicon. The polysilicon contact is activated by implementing heat treatment while offering nitride gas and oxygen gas on the polysilicon. The poly-silicon is deposited with the poly-silicon doped with the phosphorus.
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申请公布号 |
KR20100138463(A) |
申请公布日期 |
2010.12.31 |
申请号 |
KR20090057008 |
申请日期 |
2009.06.25 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JIN, SEUNG WOO;JOO, YOUNG HWAN;CHA, JAE CHUN |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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