发明名称 METHOD FOR FABRICATING CONTACTS OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A semiconductor device contact forming method is provided to restrain the writing restoration time defect and improve the operation speed of a component by reducing the contact resistance by injecting the nitride and oxygen gas into the doped polysilicon. CONSTITUTION: A contact(400) passing through the interlayer dielectric layer on a semiconductor substrate(100) is formed including the poly-silicon. The impurity is doped in polysilicon. The polysilicon contact is activated by implementing heat treatment while offering nitride gas and oxygen gas on the polysilicon. The poly-silicon is deposited with the poly-silicon doped with the phosphorus.
申请公布号 KR20100138463(A) 申请公布日期 2010.12.31
申请号 KR20090057008 申请日期 2009.06.25
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JIN, SEUNG WOO;JOO, YOUNG HWAN;CHA, JAE CHUN
分类号 H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址