发明名称 RFID TAG BEING TESTED ON THE WAFER AND METHOD THEREOF
摘要 PURPOSE: A radio-frequency-identification(RFID) tag and a method for testing the same are provided to successively test a plurality of RFID tags by applying a test signal, a power voltage signal, and a control signal directly to the internal circuit of the RFID tags. CONSTITUTION: A digital part(200) is activated by a test serial input signal and a test clock. The digital part implements a test according to the test input signal inputted from the outside. The digital part outputs a response signal after the test is terminated. Input-output pad parts(201, 202, 203) obtain a power voltage and a ground voltage from the outside. A test serial input signal, a test clock, and a test input signal are inputted to the input-output pad part.
申请公布号 KR20100138044(A) 申请公布日期 2010.12.31
申请号 KR20090056388 申请日期 2009.06.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, HEE BOK;HONG, SUK KYOUNG
分类号 G01R31/3183;G01R31/02;G06K19/07 主分类号 G01R31/3183
代理机构 代理人
主权项
地址