发明名称 INSPECTION APPARATUS OF LIGHT EMITTING DIODE
摘要 PURPOSE: An inspection device of light emitting diode, which can efficiently measure the light quantity of the light emitting diode, is provided to improve the test speed and test reliability of the light emitting diode by increasing manufacture yield and by reducing a test time. CONSTITUTION: An inspection device of light emitting diode comprises a light integration sphere(110). A light guide portion(112) is projected in one side of the integration sphere. The light guide portion guides the route of the light radiated in a light emitting diode(120). The light guide portion is arranged on the right upward of the light emitting diode. The minimum distance between the guide portion of the light emitting diode and the integration sphere is less than 3mm.
申请公布号 KR20100137594(A) 申请公布日期 2010.12.31
申请号 KR20090051981 申请日期 2009.06.11
申请人 LUMENS CO., LTD. 发明人 OH, SEUNG HYUN;KIM, BYUNG SOON
分类号 G01J1/58;H01L21/66;H01L33/48 主分类号 G01J1/58
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