发明名称 ELECTRONIC DEVICE TEST APPARATUS
摘要 TITLE : FJZJCTRCNIC DEVICE TEST APPARATUS ANELECTRONICDEVICETESTAPPARATUSBRINGINGICDEVICES (IC) INTOELECTRICAL CONTACT WITH CONTACT PARTS OF A TEST HEAD TO TEST THE IC DEVICES (IC), COMPRISING: A DEVICE CONVEYANCE SYSTEM (310) FOR TRANSFERRING THE IC DEVICES (IC) FROMA CUSTOMER TRAY (800) POSITIONED AT A WINDOWOF A LOADER UNIT TO A TEST TRAY, WHEREIN THE DEVICE CONVEYANCE SYSTEM (310) HAS PICKUP HEADS (340) HOLDING THE IC DEVICES (IC), AND THE PICKUP HEADS (340) PULLS IN THE IC DEVICES (IC) HELD AT THE CUSTOMER TRAY (800) FROM A NONCONTACT 10 STATE TO HOLD THE IC DEVICES (IC). [FTG. 11A]
申请公布号 MY142686(A) 申请公布日期 2010.12.31
申请号 MYPI20071921 申请日期 2006.10.04
申请人 ADVANTEST CORPORATION 发明人 SAGAWA, MAKOTO
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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