发明名称 |
METHOD FOR FORMING INSULATING LAYER IN SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A semiconductor device insulating layer forming method is provided to improve the property of an insulation layer by controlling the distribution of nitride ion within the silicon oxynitride. CONSTITUTION: A semiconductor substrate(100) formed with the silicon oxide is loaded into a chamber. The plasma is ignited while being surrounded by inert gas by injecting inert gas into the chamber. The nitrogen gas is injected within the chamber in order to ignite the silicon oxide. The step of igniting the plasma is implemented in the temperature of 100 to 600 degree.
|
申请公布号 |
KR20100138466(A) |
申请公布日期 |
2010.12.31 |
申请号 |
KR20090057011 |
申请日期 |
2009.06.25 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, TAE JUNG;KIM, SU HO;KIM, DO YEON |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|