发明名称 TRENCH SCHOTTKY DIODE AND METHOD FOR MANUFACTURING THE SAME
摘要 A trench Schottky diode and its manufacturing method are provided. The trench Schottky diode includes a semiconductor substrate having therein a plurality of trenches, a gate oxide layer, a polysilicon structure, a guard ring and an electrode. At first, the trenches are formed in the semiconductor substrate by an etching step. Then, the gate oxide layer and the polysilicon structure are formed in the trenches and protrude above a surface of the semiconductor substrate. The guard ring is formed to cover a portion of the resultant structure. At last, the electrode is formed above the guard ring and the other portion not covered by the guard ring. The protruding gate oxide layer and the protruding polysilicon structure can avoid cracks occurring in the trench structure.
申请公布号 US2010327288(A1) 申请公布日期 2010.12.30
申请号 US20100824539 申请日期 2010.06.28
申请人 PFC DEVICE CORPORATION 发明人 CHAO KOU-LIANG;KUO HUNG-HSIN;SU TSE-CHUAN;CHEN MEI-LING
分类号 H01L29/872;H01L21/04;H01L21/329 主分类号 H01L29/872
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