发明名称 Oxide semiconductor target and manufacturing method of oxide semiconductor device by using the same
摘要 An oxide semiconductor target of a ZTO (zinc tin complex oxide) type oxide semiconductor material of an appropriate (Zn/(Zn+Sn)) composition having high mobility and threshold potential stability and with less restriction in view of the cost and the resource and with less restriction in view of the process, and an oxide semiconductor device using the same, in which a sintered Zn tin complex oxide with a (Zn/(Zn+Sn)) composition of 0.6 to 0.8 is used as a target, the resistivity of the target itself is at a high resistance of 1 &OHgr;cm or higher and, further, the total concentration of impurities is controlled to 100 ppm or less.
申请公布号 US2010330738(A1) 申请公布日期 2010.12.30
申请号 US20100662305 申请日期 2010.04.09
申请人 HITACHI METALS, LTD. 发明人 UCHIYAMA HIROYUKI;WAKANA HIRONORI;KAWAMURA TETSUFUMI;KURITA FUMI;FUKUSHIMA HIDEKO
分类号 H01L21/36;C23C14/34;C23C14/35;H01L21/365 主分类号 H01L21/36
代理机构 代理人
主权项
地址